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Caption
Low-temperature, ultra-high-vacuum, combined atomic force microscope / scanning tunneling microscope at UCLA.
Credit
UCLA
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![](/sites/default/files/styles/photo_gallery_515_x_325_/public/2.%20Atomic%20Force%20Microscope.jpg?itok=ayq3BKp1)
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Atomic force microscope.
Credit
nano.gov
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![](/sites/default/files/styles/photo_gallery_515_x_325_/public/3.%20Nobel%20Prize.jpg?itok=al8erq9H)
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Inventors of the scanning tunneling microscope, Gerd Binnig and Heinrich Rohrer, who won a Nobel Prize for their technology.
Credit
nano.gov
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![](/sites/default/files/styles/photo_gallery_515_x_325_/public/4.%20Transmission%20electron%20microscope.jpg?itok=N45EFJDC)
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A transmission electron microscope from the 1970s.
Credit
Deutsche Fotothek
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![](/sites/default/files/styles/photo_gallery_515_x_325_/public/5.%20Scanning%20Electron%20Microscope.jpg?itok=q2tJ4h3M)
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The first scanning electron microscope.
Credit
www.ardenne.de/med
Photo
Caption
Low-temperature, ultra-high-vacuum, combined atomic force microscope / scanning tunneling microscope at UCLA.
Credit
UCLA
Low-temperature, ultra-high-vacuum, combined atomic force microscope / scanning tunneling microscope at UCLA.
UCLA
February 14, 2025